Kimishima Y.(kimi@ynu.ac.jp), Uehara M., Kuramoto T., Takami S., Okuda T.
Ключевые слова: MgB2, doping effect, pinning, bulk, magnetization curves, critical current density, fabrication, critical caracteristics, magnetic properties
Kakimoto K., Sutoh Y., Ajimura S., Saitoh T.(tsaitoh@fujikura.co.jp), Kaneko N., Hanyu S., Iijima Y.(iijimay@fujikura.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, long conductors, fabrication, length
Iijima Y., Kakimoto K., Sutoh Y., Saitoh T.(tsaitoh@fujikura.co.jp), Hanyu S., Kaneko N.(nkaneko@fujikura.co.jp)
Ключевые слова: HTS, YBCO, IBAD process, template layers, substrate Ni alloy, nanoscaled roughness, grain alignment, fabrication, coated conductors
Li X., Nishijima G., Awaji S., Watanabe K., Zhang X., Ma Y.(ywma@mail.iee.ac.cn), Xu A.
Ключевые слова: MgB2, bulk, fabrication, magnetic field dependence, Jc/B curves, experimental results, critical caracteristics
Furuse M., Fuchino S., Funaki K., Kajikawa K.(kajikawa@sc.kyushu-u.ac.jp), Hayashi T., Mawatari Y., Enpuku K., Iiyama Y.
Ключевые слова: cables three-phase, ac losses, HTS, modeling, numerical analysis, power equipment, new
Kikuchi A., Yoshida Y., Iijima Y., Takeuchi T., Nishimura A., Hishinuma Y.(hishinuma.yoshimotsu@nifs.ac.jp)
Ключевые слова: MgB2, doping effect, wires, phase formation, Jc/B curves, composition, fabrication, critical caracteristics
Ключевые слова: patents, magnets, shields, magnetic field distribution, MRI magnets, LTS, magnetic properties, medical applications
Hirano S., Hishinuma Y., Fujimoto H., Sato T., Yoshizawa S.(yoshizaw@chem.meisei-u.ac.jp), Ohta H., Kohayashi S., Nakane H.
Kikuchi A., Iijima Y., Banno N., Takeuchi T.(TAKEUCHI.Takao@nims.go.jp), Kosuge M.
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Saitoh T., Kakimoto K., Kato T., Hirayama T., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, texture, fabrication
Iijima Y., Muroga T., Nagaya S., Kashima N., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Niwa T., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, CVD process, multistage process, substrate Hastelloy, grain alignment, microstructure, fabrication
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Matsuda J., Koyanagi S.
Ключевые слова: HTS, YBCO, coated conductors, trapped field, measurement technique, experimental results, magnetic properties
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Tokutomi H., Shoyama T.
Iijima Y., Saitoh T., Watanabe T., Kakimoto K., Yamada Y., Sakai N., Chikumoto N., Tajima S., Kato J.Y.(yoshioka@istec.or.jp)
Iijima Y., Kiss T., Saitoh T., Izumi T., Shiohara Y., Iwakuma M.(iwakuma@sc.kyushu-u.ac.jp), Funaki K., Yamada Y., Nigo M., Inoue D., Miyamoto N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y.(ysutoh@fujikura.co.jp), Kaneko N.
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
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